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SkyScan µ-CT

Site last updated 06 Jun 2008
e2vsi.webmaster@e2v.com

X-Ray Fluorescence (XRF) is widely used technique for materials analysis in industrial quality control, raw material analysis and research applications.

A source of x-rays is used to excite the atoms of the target material and the resulting emission of characteristic x-rays is observed using an energy dispersive x-ray (EDX) detector.

Applications
XRF

Typically the primary x-rays are incident on the sample at an angle of 45 degrees to the surface, and the fluorescence x-rays are detected also at 45 degrees to the surface and 90 degrees to the primary source. For industrial applications it is convenient to analyse the underside of samples and the resulting detector geometry will be similar to that shown.

Typical industrial XRF detector

In Micro-XRF (µ-XRF or MXRF), the excitation x-ray beam is highly focussed to a small spot. By scanning the sample and measuring x-ray spectra, and at the same time recording optical images, elemental analysis can be made at discrete points on the sample sutrface.

e2v scientific instrumentshas perfected the design of detectors specifically for EDXRF applications. Specialised internal collimation not only enables optimum performance over the wide range of energies typically encountered in XRF applications, but also significantly reduces background fluorescence from detector component materials.

Similar studies are made in research applications but typically the x-ray source will be a synchrotron instead of an x-ray tube and monochromatic x-rays can be used with high intensities.

For all types of XRF application, e2v scientific instruments EDX detectors offer high spectral quality - excellent resolution, high peak to background ratios and exceptional peak shapes over a wide energy range [detector performance parameters defined].

Typical e2v scientific instruments XRF Detector Spectrum (50mm² Si(Li)) - excellent high energy performance