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e2v scientific instruments x-ray products |
Distributed products (UK only) |
Site last updated 06 Jun 2008
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| Transmission Electron Microscopes (TEM) represent a challenging environment for EDX detectors. e2v scientific instruments has developed a range of detectors with integrated features specifically designed to meet these challenges. | Applications |
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In the TEM, the electron beam passes through a very thin sample. Typically the electron beam accelerating voltages are much higher than in a Scanning Electron Microscope (SEM) and the x-ray yield can be much lower. The environment requires very high vacuum and ultra-clean conditions. When operating the TEM in low magnification mode, the electron beam can easily come into contact with a supporting grid bar which results in a sudden dramatic increase in x-ray intensity together with scattered high energy electrons, neither of which are very kind to EDX detectors. e2v scientific instruments 'Sirius' Si(Li) TEM detectors overcome these conditions with the following features:
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30mm² or 50mm² Si(Li) crystals for improved solid angle.